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"Sample Size and Number of Failure Requirements for Demonstration Tests ..."

Scott W. McKane, Luis A. Escobar, William Q. Meeker (2005)

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DOI: 10.1198/004017005000000030

access: closed

type: Journal Article

metadata version: 2017-05-27

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Scott W. McKane, Luis A. Escobar, William Q. Meeker:
Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. Technometrics 47(2): 182-190 (2005)

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