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"EffiTest2: Efficient Delay Test and Prediction for Post-Silicon Clock Skew ..."

Grace Li Zhang et al. (2019)

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DOI: 10.1109/TCAD.2018.2818713

access: closed

type: Journal Article

metadata version: 2022-12-13

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  - https://dblp.org/rec/journals/tcad/Zhang0SHS19
Grace Li Zhang, Bing Li, Yiyu Shi, Jiang Hu, Ulf Schlichtmann:
EffiTest2: Efficient Delay Test and Prediction for Post-Silicon Clock Skew Configuration Under Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(4): 705-718 (2019)

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