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"Circuits for pseudoexhaustive test pattern generation."
Laung-Terng Wang, Edward J. McCluskey (1988)
- Laung-Terng Wang, Edward J. McCluskey:
Circuits for pseudoexhaustive test pattern generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(10): 1068-1080 (1988)
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