"A genetic algorithm framework for test generation."

Elizabeth M. Rudnick et al. (1997)

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DOI: 10.1109/43.658571

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/RudnickPGN97
Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann:
A genetic algorithm framework for test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(9): 1034-1044 (1997)

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