"Storage-Based Logic Built-In Self-Test With Cyclic Tests."

Irith Pomeranz (2023)

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DOI: 10.1109/TCAD.2022.3233737

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type: Journal Article

metadata version: 2023-09-14

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Irith Pomeranz:
Storage-Based Logic Built-In Self-Test With Cyclic Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3118-3122 (2023)

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