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"Functionally Possible Scan-Based Test Set as a Dual of a Compressed ..."
Irith Pomeranz (2023)
- Irith Pomeranz:
Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1336-1345 (2023)
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