"Topping Off Test Sets Under Bounded Transparent Scan."

Irith Pomeranz (2023)

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DOI: 10.1109/TCAD.2022.3167885

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type: Journal Article

metadata version: 2023-01-15

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Irith Pomeranz:
Topping Off Test Sets Under Bounded Transparent Scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(1): 341-345 (2023)

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