"Multicycle Tests With Fault Detection Test Data for Improved Logic Diagnosis."

Irith Pomeranz (2022)

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DOI: 10.1109/TCAD.2021.3079146

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type: Journal Article

metadata version: 2022-05-18

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Irith Pomeranz:
Multicycle Tests With Fault Detection Test Data for Improved Logic Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(5): 1587-1591 (2022)

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