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"Static Test Compaction Using Independent Suffixes of a Transparent-Scan ..."

Irith Pomeranz (2022)

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DOI: 10.1109/TCAD.2021.3073625

access: closed

type: Journal Article

metadata version: 2022-04-01

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Irith Pomeranz:
Static Test Compaction Using Independent Suffixes of a Transparent-Scan Sequence. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(4): 1130-1141 (2022)

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