"PRESERVE: Static Test Compaction that Preserves Individual Numbers of Tests."

Irith Pomeranz (2021)

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DOI: 10.1109/TCAD.2020.3005371

access: closed

type: Journal Article

metadata version: 2021-04-29

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Irith Pomeranz:
PRESERVE: Static Test Compaction that Preserves Individual Numbers of Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(4): 803-807 (2021)

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