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"Direct Computation of LFSR-Based Stored Tests for Broadside and ..."

Irith Pomeranz (2020)

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DOI: 10.1109/TCAD.2020.2966452

access: closed

type: Journal Article

metadata version: 2020-12-01

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Irith Pomeranz:
Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 5238-5246 (2020)

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