"Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan ..."

Irith Pomeranz (2018)

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DOI: 10.1109/TCAD.2017.2748020

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type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan by Observation Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(6): 1278-1287 (2018)

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