"Static Test Compaction for Scan Circuits by Using Restoration to Modify ..."

Irith Pomeranz (2014)

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DOI: 10.1109/TCAD.2014.2358932

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type: Journal Article

metadata version: 2022-08-16

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Irith Pomeranz:
Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 1955-1964 (2014)

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