"Non-Test Cubes for Test Generation Targeting Hard-to-Detect Faults."

Irith Pomeranz (2013)

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DOI: 10.1109/TCAD.2013.2275431

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Non-Test Cubes for Test Generation Targeting Hard-to-Detect Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(12): 1957-1965 (2013)

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