"Scan Shift Power of Functional Broadside Tests."

Irith Pomeranz (2011)

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DOI: 10.1109/TCAD.2011.2149890

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type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Scan Shift Power of Functional Broadside Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(9): 1416-1420 (2011)

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