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"Reducing test-data volume using P-testable scan chains in circuits with ..."

Irith Pomeranz (2004)

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DOI: 10.1109/TCAD.2004.835131

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Reducing test-data volume using P-testable scan chains in circuits with multiple scan chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(10): 1465-1478 (2004)

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