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"On the use of random limited-scan to improve at-speed randompattern ..."
Irith Pomeranz (2002)
- Irith Pomeranz:
On the use of random limited-scan to improve at-speed randompattern testing of scan circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(9): 1068-1076 (2002)
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