"Improving DRAM Reliability Using a High Order Error Correction Code."

Wei Li et al. (2024)

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DOI: 10.1109/TCAD.2024.3400677

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type: Journal Article

metadata version: 2025-03-03

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Wei Li, Meng Zhang, Tianwei Gui, Zheng Fang, Changsheng Xie, Fei Wu:
Improving DRAM Reliability Using a High Order Error Correction Code. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(12): 4775-4785 (2024)

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