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"Improving DRAM Reliability Using a High Order Error Correction Code."
Wei Li et al. (2024)
- Wei Li
, Meng Zhang
, Tianwei Gui
, Zheng Fang, Changsheng Xie
, Fei Wu
:
Improving DRAM Reliability Using a High Order Error Correction Code. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(12): 4775-4785 (2024)

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