"Pseudorandom test-length analysis using differential solutions."

Dan Li, Wen-Ben Jone (1996)

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DOI: 10.1109/43.503948

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dan Li, Wen-Ben Jone:
Pseudorandom test-length analysis using differential solutions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(7): 815-825 (1996)

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