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"Hierarchical test generation under architectural level functional constraints."
Jaushin Lee, Janak H. Patel (1996)
- Jaushin Lee, Janak H. Patel:
Hierarchical test generation under architectural level functional constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(9): 1144-1151 (1996)

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