"Architectural level test generation for microprocessors."

Jaushin Lee, Janak H. Patel (1994)

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DOI: 10.1109/43.317464

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type: Journal Article

metadata version: 2020-09-24

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Jaushin Lee, Janak H. Patel:
Architectural level test generation for microprocessors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(10): 1288-1300 (1994)

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