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"Cross-Layer Modeling and Simulation of Circuit Reliability."

Yu Cao et al. (2014)

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DOI: 10.1109/TCAD.2013.2289874

access: closed

type: Journal Article

metadata version: 2021-04-15

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  - journals/tcad/CaoVSCAEBF14
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  - https://dblp.org/rec/journals/tcad/CaoVSCAEBF14
Yu Cao, Jyothi Velamala, Ketul Sutaria, Mike Shuo-Wei Chen, Jonathan Ahlbin, Ivan Sanchez Esqueda, Michael Bajura, Michael Fritze:
Cross-Layer Modeling and Simulation of Circuit Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(1): 8-23 (2014)

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