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"Diagnosis of Interconnect Full Open Defects in the Presence of Gate ..."

Daniel Arumí et al. (2013)

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DOI: 10.1109/TCAD.2012.2228269

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/ArumiMFEHK13
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 301-312 (2013)

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