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"A March Test for Functional Faults in Semiconductor Random Access Memories."
Dong S. Suk, Sudhakar M. Reddy (1981)
- Dong S. Suk, Sudhakar M. Reddy:
A March Test for Functional Faults in Semiconductor Random Access Memories. IEEE Trans. Computers 30(12): 982-985 (1981)

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