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"Built-In Testing of Integrated Circuit Wafers."
Sampath Rangarajan, Donald S. Fussell, Miroslaw Malek (1990)
- Sampath Rangarajan, Donald S. Fussell, Miroslaw Malek:
Built-In Testing of Integrated Circuit Wafers. IEEE Trans. Computers 39(2): 195-205 (1990)
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