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"Built-In Testing of Integrated Circuit Wafers."

Sampath Rangarajan, Donald S. Fussell, Miroslaw Malek (1990)

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DOI: 10.1109/12.45205

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/RangarajanFM90
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  persistent URL:
  - https://dblp.org/rec/journals/tc/RangarajanFM90
Sampath Rangarajan, Donald S. Fussell, Miroslaw Malek:
Built-In Testing of Integrated Circuit Wafers. IEEE Trans. Computers 39(2): 195-205 (1990)

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