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ORCID"Parallel Testing for Pattern-Sensitive Faults in Semiconductor ..."
Pinaki Mazumder, Janak H. Patel (1989)
- Pinaki Mazumder, Janak H. Patel:
Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Trans. Computers 38(3): 394-407 (1989)
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