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"Procedures for Eliminating Static and Dynamic Hazards in Test Generation."

Melvin A. Breuer, R. Loyd Harrison (1974)

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DOI: 10.1109/T-C.1974.223807

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/BreuerH74
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  persistent URL:
  - https://dblp.org/rec/journals/tc/BreuerH74
Melvin A. Breuer, R. Loyd Harrison:
Procedures for Eliminating Static and Dynamic Hazards in Test Generation. IEEE Trans. Computers 23(10): 1069-1078 (1974)

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