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"Matching Misaligned Two-Resolution Metrology Data."
Yaping Wang, Erick Moreno-Centeno, Yu Ding (2017)
- Yaping Wang
, Erick Moreno-Centeno, Yu Ding:
Matching Misaligned Two-Resolution Metrology Data. IEEE Trans Autom. Sci. Eng. 14(1): 222-237 (2017)
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