"Model checker aided design of a controller for a wafer scanner."

Martijn Hendriks, Barend van den Nieuwelaar, Frits W. Vaandrager (2006)

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DOI: 10.1007/S10009-006-0025-7

access: closed

type: Journal Article

metadata version: 2020-04-02

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  - https://dblp.org/rec/journals/sttt/HendriksNV06
Martijn Hendriks, Barend van den Nieuwelaar, Frits W. Vaandrager:
Model checker aided design of a controller for a wafer scanner. Int. J. Softw. Tools Technol. Transf. 8(6): 633-647 (2006)

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