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"An Intelligent Metrology Architecture With AVM for Metal Additive ..."

Haw Ching Yang et al. (2019)

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DOI: 10.1109/LRA.2019.2921927

access: open

type: Journal Article

metadata version: 2020-10-26

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  dblp key:
  - journals/ral/YangAHCLH19
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  - https://dblp.org/rec/journals/ral/YangAHCLH19
Haw Ching Yang, Muhammad Adnan, Chih-Hung Huang, Fan-Tien Cheng, Yu-Lung Lo, Chih-Hua Hsu:
An Intelligent Metrology Architecture With AVM for Metal Additive Manufacturing. IEEE Robotics Autom. Lett. 4(3): 2886-2893 (2019)

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