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"Which paradigm can improve the reliability of next-generation measurement ..."

Satoshi Imai, Takahiro Yamaguchi, Givargis A. Danialy (1992)

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DOI: 10.1145/157709.157739

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-13

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  - https://dblp.org/rec/journals/oopsm/ImaiYD93
Satoshi Imai, Takahiro Yamaguchi, Givargis A. Danialy:
Which paradigm can improve the reliability of next-generation measurement system software. OOPSLA Addendum 1992: 153-155

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