default search action
"Autocalibration method for scanning electron microscope using affine ..."
Andrey V. Kudryavtsev et al. (2020)
- Andrey V. Kudryavtsev, Valérian Guelpa, Patrick Rougeot, Olivier Lehmann, Sounkalo Dembélé, Peter Sturm, Nadine Le Fort-Piat:
Autocalibration method for scanning electron microscope using affine camera model. Mach. Vis. Appl. 31(7): 69 (2020)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.