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"Analysis of the UIS behavior of power devices by means of SPICE-based ..."

Vincenzo d'Alessandro et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.083

access: closed

type: Journal Article

metadata version: 2021-10-14

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Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace:
Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. Microelectron. Reliab. 53(9-11): 1713-1718 (2013)

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