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"High resolution AFM scanning Moiré method and its application to ..."
Huimin Xie et al. (2002)
- Huimin Xie, Anand K. Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi:
High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectron. Reliab. 42(8): 1219-1227 (2002)
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