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"Correlation studies for component level ball impact shear test and board ..."

Ee-Hua Wong et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.04.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/WongRSSDCZOTLELY08
Ee-Hua Wong, Ranjan Rajoo, S. K. W. Seah, C. S. Selvanayagam, W. D. van Driel, J. F. J. M. Caers, X. J. Zhao, N. Owens, L. C. Tan, M. Leoni, P. L. Eu, Y.-S. Lai, C.-L. Yeh:
Correlation studies for component level ball impact shear test and board level drop test. Microelectron. Reliab. 48(7): 1069-1078 (2008)

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