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"Importance of multi-temp testing in automotive qualification and zero ..."

Zhichun Wang, P. Zeelen, H. Tigelaar (2007)

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DOI: 10.1016/J.MICROREL.2007.07.026

access: closed

type: Journal Article

metadata version: 2021-03-29

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Zhichun Wang, P. Zeelen, H. Tigelaar:
Importance of multi-temp testing in automotive qualification and zero defects program. Microelectron. Reliab. 47(9-11): 1358-1361 (2007)

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