"High frequency characterization and modelling of the parasitic RC ..."

Vesselin K. Vassilev et al. (2003)

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DOI: 10.1016/S0026-2714(03)00129-X

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type: Journal Article

metadata version: 2023-10-31

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Vesselin K. Vassilev, Snezana Jenei, Guido Groeseneken, Rafael Venegas, Steven Thijs, Vincent De Heyn, M. Natarajan Iyer, Michiel Steyaert, Herman E. Maes:
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectron. Reliab. 43(7): 1011-1020 (2003)

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