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"Interface traps density-of-states as a vital component for hot-carrier ..."

Stanislav Tyaginov et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.030

access: closed

type: Journal Article

metadata version: 2023-09-30

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Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser:
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50(9-11): 1267-1272 (2010)

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