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C. Jungemann

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Journal Articles

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2011
[j3]
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  - journals/mr/TyaginovSEJPSOCG11
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  - https://dblp.org/rec/journals/mr/TyaginovSEJPSOCG11
Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser:
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51(9-11): 1525-1529 (2011)
2010
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Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser:
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50(9-11): 1267-1272 (2010)
2001
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C. Jungemann, Burkhard Neinhüs, Bernd Meinerzhagen:
Investigation of the Local Force Approximation in Numerical Device Simulation by Full-band Monte Carlo Simulation. VLSI Design 13(1-4): 281-285 (2001)

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