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"A novel method to improve cell endurance window in source-side injection ..."

Yong-Shiuan Tsair et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.12.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/TsairFJWCLT12
Yong-Shiuan Tsair, Yean-Kuen Fang, Feng-Renn Juang, Yu-Hsiung Wang, Wen-Ting Chu, Yung-Tao Lin, Luan Tran:
A novel method to improve cell endurance window in source-side injection split gate flash memory. Microelectron. Reliab. 52(6): 1055-1059 (2012)

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