"Experimental extraction of degradation parameters after constant voltage ..."

C. Trapes, Didier Goguenheim, Alain Bravaix (2005)

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DOI: 10.1016/J.MICROREL.2004.10.025

access: closed

type: Journal Article

metadata version: 2023-09-30

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C. Trapes, Didier Goguenheim, Alain Bravaix:
Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides. Microelectron. Reliab. 45(5-6): 883-886 (2005)

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