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"The influence of technology variation on ggNMOSTs and SCRs against CDM BSD ..."

M. S. B. Sowariraj et al. (2002)

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DOI: 10.1016/S0026-2714(02)00136-1

access: closed

type: Journal Article

metadata version: 2021-10-14

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M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper:
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectron. Reliab. 42(9-11): 1287-1292 (2002)

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