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"Low-frequency noise in hot-carrier degraded nMOSFETs."
Cora Salm et al. (2007)
- Cora Salm
, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz
:
Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectron. Reliab. 47(4-5): 577-580 (2007)
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