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"Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO ..."
Muhammad Sajid et al. (2017)
- Muhammad Sajid
, Nikolay G. Chechenin, Frank Sill Torres
, Usman Ali Gulzari
, Muhammad Usman Butt, Zhu Ming, E. U. Khan:
Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments. Microelectron. Reliab. 78: 11-16 (2017)
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