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"Testing process precision for truncated normal distributions."

Wen Lea Pearn et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.12.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wen Lea Pearn, H. N. Hung, N. F. Peng, C. Y. Huang:
Testing process precision for truncated normal distributions. Microelectron. Reliab. 47(12): 2275-2281 (2007)

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