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"Noise and transport characterisation of tantalum capacitors."

Jan Pavelka et al. (2002)

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DOI: 10.1016/S0026-2714(02)00013-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/PavelkaSVSTH02
Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi:
Noise and transport characterisation of tantalum capacitors. Microelectron. Reliab. 42(6): 841-847 (2002)

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