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"Increased hot carrier effects in Gate-All-Around SOI nMOSFET's."

Jong Tae Park et al. (2003)

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DOI: 10.1016/S0026-2714(03)00254-3

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/mr/ParkCYJC03
Jong Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge:
Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. Microelectron. Reliab. 43(9-11): 1427-1432 (2003)

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