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"A study of metamorphic HEMT technological improvements: Impact on ..."

O. Pajona, Christelle Aupetit-Berthelemot, Jean-Michel Dumas (2007)

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DOI: 10.1016/J.MICROREL.2007.07.063

access: closed

type: Journal Article

metadata version: 2020-02-22

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O. Pajona, Christelle Aupetit-Berthelemot, Jean-Michel Dumas:
A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models. Microelectron. Reliab. 47(9-11): 1643-1648 (2007)

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