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"Inversion of degradation direction of n-channel MOS-FETs in off-state ..."

A. Muehlhoff (2002)

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DOI: 10.1016/S0026-2714(02)00168-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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A. Muehlhoff:
Inversion of degradation direction of n-channel MOS-FETs in off-state operation. Microelectron. Reliab. 42(9-11): 1453-1456 (2002)

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