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"Compact failure modeling for devices subject to electrostatic discharge ..."
Meng Miao et al. (2015)
- Meng Miao, Yuanzhong Paul Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou:
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectron. Reliab. 55(1): 15-23 (2015)
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